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Mini-LED 光學(xué)檢測機(jī) Optical Inspector

產(chǎn)品介紹

        Mini-LED 光學(xué)檢測機(jī)(Optical Inspector)解決超微晶片不足0.1毫米,體積小、布局密,質(zhì)檢難度極高的難題;該設(shè)備采用高分辨率相機(jī)和AI增強(qiáng)算法,能夠準(zhǔn)確檢測出偏移、錫膏、亮度、缺焊等10多種缺陷特征;同時進(jìn)行外觀檢測與點亮檢測,漏檢率小于0.1%,檢測精度優(yōu)于5um,檢測速度2000mm2/秒。

Mini-Led 光學(xué)檢測機(jī)

Mini-LED 光學(xué)檢測機(jī)適用范圍

    可檢測最小3*5mil芯片 / Can detect 3*5 mil chips.

    支持單板超10萬顆芯片 / Supports single-board over 100,000 chips.

    爐前爐后外觀檢測 / Pre-bake and post-bake opticalinspection.


Mini-LED 光學(xué)檢測機(jī)檢測項目

    少件、偏位、固翻、異物、旋轉(zhuǎn)、重疊、立碑、浮高、缺件、多件

        Missing part, misalignment, flipped components, foreign objects, rotation, overlap, tombstoning, lifted components, multiple components.

圖片

Mini-LED 光學(xué)檢測機(jī)技術(shù)優(yōu)勢

    檢測陣列自動生成,自動修正。多點測高,自動補(bǔ)償高度差

        Automated generation and correction of detection arrays. Multi-point height measurement with automatic compensation for height differences.


    專利光源配合高分辨率鏡頭,捕捉超微缺陷

        Patented light source combined with high-resolution lenses to capture ultra-fine defects.

Mini-LED 光學(xué)檢測機(jī)設(shè)備特點

    解決超微晶片不足0.1毫米,體積小、布局密,質(zhì)檢難度極高的難題。

        Solving the challenge of inspecting ultra-small chips, less than 0.1 miimeters in size, with small volume and dense layout, presents an extremely high difficulty in quality inspection.


    采用高分辨率相機(jī)和AI增強(qiáng)算法,能夠準(zhǔn)確檢測出偏移、錫膏、亮度、缺焊等10多種缺陷特征。

        By employing high-resolution cameras and Al-enhanced algorithms, the system can accurately detect over 10 types of defect features including misalignment, solder paste. brightness, and solder voids.


    同時進(jìn)行外觀檢測與點亮檢測,漏檢率小于0.1%,檢測精度優(yōu)于5um,檢測速度2000mm2/秒。

        Simultaneous appearance and illumination inspection, with a false negative rate of less than 0.1%, detection accuracy better than 5um, achieving a detection speed of 2000 mm2/second.



TAG: 光學(xué)檢測/芯片檢測/光學(xué)檢測機(jī)/AOI檢測/

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